PPP-FMR Force Modulation Microscopy AFM Probe from Park Systems Inc

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PPP-FMR Force Modulation Microscopy AFM Probe

Description

The Pyrex-Nitride Probes (PNP) have silicon nitride cantilevers with very low force constants and integrated oxide sharpened, pyramidal tips with a height of 3.5 µm. The tip is located 4 µm behind the free end of the cantilever. The probe series features a support chip that is made of Pyrex. The TR series features two different triangular cantilevers. Both sides of the chip have identical cantilevers. All cantilevers are stress compensated and have a 65 nm chromium / gold backside coating for high laser reflectance.